Open Access. Powered by Scholars. Published by Universities.®
Articles 1 - 2 of 2
Full-Text Articles in Physics
Apparent And True Feature Heights In Force Microscopy, Nancy Burnham
Apparent And True Feature Heights In Force Microscopy, Nancy Burnham
Nancy A. Burnham
In a force microscope, the stiffness of the cantilever beam convolutes with the tip‐sample interaction stiffness to influence the data in a systematic way. The analysis presented here relates the measured feature height to the true feature height in the variable force, constant force, and constant force gradient modes of operation. In this way, one can understand previously published data: the enhanced measured atomic corrugation observed in high resolution force microscopy images, its increase with load, and the improved resolution of lateral force images. The correct interaction stiffness can be obtained for use in surface force and mechanical properties studies. …
Burnham, Colton, And Pollock Reply, Nancy Burnham, Rj Colton, Hm Pollock
Burnham, Colton, And Pollock Reply, Nancy Burnham, Rj Colton, Hm Pollock
Nancy A. Burnham
It is not necessary to obtain permission to reuse this article or its components as it is available under the terms of the Creative Commons Attribution 3.0 License. This license permits unrestricted use, distribution, and reproduction in any medium, provided attribution to the author (s) and the published article's title, journal citation, and DOI are maintained. Please note that some figures may have been included with permission from other third parties. It is your responsibility to obtain the proper permission from the rights holder