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City University of New York (CUNY)

1992

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The Application Of Liquid Junctions For Characterization Of Semiconductor Materials, Wu-Mian Shen Jan 1992

The Application Of Liquid Junctions For Characterization Of Semiconductor Materials, Wu-Mian Shen

Dissertations, Theses, and Capstone Projects

In this study, liquid junctions were used to characterize silicon and silicon subjected to various reactive ion etching (RIE); surface optimization of CuInSe{dollar}\sb2{dollar}; and photo-modification of InSe. Impedance spectroscopy and modulation spectroscopies such as electrolyte electroreflectance (EER), photoreflectance (PR), and photoreflectance in the presence of electrolyte (EPR) were the major methodologies that were used for investigating the dielectric properties of the semiconductors and their interface with the ambients. It was shown that the above experimental techniques provide information about the flat-band potential, doping density, Fermi level pinning, the density and distribution of surface states, energy gap and broadening parameter related …