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Nanoscience and Nanotechnology

Physics Faculty Publications and Presentations

Transmission electron microscopy

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Full-Text Articles in Physics

Automated Nanocrystal Orientation And Phase Mapping In The Transmission Electron Microscope On The Basis Of Precession Electron Diffraction, Edgar F. Rauch, Joaquin Portillo, Stavros Nicolopoulos, Daniel Bultreys, Sergei Rouvimov, Peter Moeck Mar 2010

Automated Nanocrystal Orientation And Phase Mapping In The Transmission Electron Microscope On The Basis Of Precession Electron Diffraction, Edgar F. Rauch, Joaquin Portillo, Stavros Nicolopoulos, Daniel Bultreys, Sergei Rouvimov, Peter Moeck

Physics Faculty Publications and Presentations

An automated technique for the mapping of nanocrystal phases and orientations in a transmission electron microscope is described. It is primarily based on the projected reciprocal lattice geometry that is extracted from electron diffraction spot patterns. Precession electron diffraction patterns are especially useful for this purpose. The required hardware allows for a scanning-precession movement of the primary electron beam on the crystalline sample and can be interfaced to any older or newer mid-voltage transmission electron microscope (TEM). Experimentally obtained crystal phase and orientation maps are shown for a variety of samples. Comprehensive commercial and open-access crystallographic databases may be used …


Automated Crystal Phase And Orientation Mapping Of Nanocrystals In A Transmission Electron Microscope, Peter Moeck, Sergei Rouvimov, Edgar F. Rauch, Stavros Nicolopoulos May 2009

Automated Crystal Phase And Orientation Mapping Of Nanocrystals In A Transmission Electron Microscope, Peter Moeck, Sergei Rouvimov, Edgar F. Rauch, Stavros Nicolopoulos

Physics Faculty Publications and Presentations

An automated technique for the mapping of nanocrystal phases and orientations in a transmission electron microscope (TEM) is described. It is based on the projected reciprocal lattice geometry that is extracted from electron diffraction spot patterns. The required hardware allows for a scanning‐precession movement of the primary electron beam on the crystalline sample and can be interfaced to any newer or older TEM. The software that goes with this hardware is flexible in its intake of raw data so that it can also create orientation and phase maps of nanocrystal from high resolution TEM (HRTEM) images. When the nanocrystals possess …


Three-Dimensional Structure Of Cdx (X= Se, Te) Nanocrystals By Total X-Ray Diffraction, S. K. Pradhan, Z. T. Deng, F. Tang, Y. Ren, Peter Moeck, V. Petkov Jan 2007

Three-Dimensional Structure Of Cdx (X= Se, Te) Nanocrystals By Total X-Ray Diffraction, S. K. Pradhan, Z. T. Deng, F. Tang, Y. Ren, Peter Moeck, V. Petkov

Physics Faculty Publications and Presentations

The three-dimensional structure of oleic acid-capped CdSe and thiol-capped CdTe nanocrystals used as quantum dots has been determined by total synchrotron radiationx-ray diffraction and atomic pair distribution function analysis. Both CdSe and CdTe are found to exhibit the zinc-blende-type atomic ordering. It is only slightly distorted in CdSe implying the presence of nanosize domains and very heavily distorted in CdTe due to the presence of distinct core-shell regions. The results well demonstrate the great potential of the experimental approach and thus encourage its wider application in quantum dot research.