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Full-Text Articles in Physics
Multiple Determination Of The Optical Constants Of Thin-Film Coating Materials, D. P. Arndt, R. M.A. Azzam, J. M. Bennett, J. P. Borgogno, C. K. Carniglia, W. E. Case, J. A. Dobrowolski, U. J. Gibson, T. Tuttle Hart, F. C. Ho, V. A. Hodgkin, W. P. Klapp, H. A. Macleod, E. Pelletier, M. K. Purvis, D. M. Quinn, D. H. Strome, R. Swenson, P. A. Temple, T. F. Thonn
Multiple Determination Of The Optical Constants Of Thin-Film Coating Materials, D. P. Arndt, R. M.A. Azzam, J. M. Bennett, J. P. Borgogno, C. K. Carniglia, W. E. Case, J. A. Dobrowolski, U. J. Gibson, T. Tuttle Hart, F. C. Ho, V. A. Hodgkin, W. P. Klapp, H. A. Macleod, E. Pelletier, M. K. Purvis, D. M. Quinn, D. H. Strome, R. Swenson, P. A. Temple, T. F. Thonn
Electrical Engineering Faculty Publications
The seven participating laboratories received films of two different thicknesses of Sc2O3 and Rh. All samples of each material were prepared in a single deposition run. Brief descriptions are given of the various methods used for determination of the optical constants of these coating materials. The measurement data are presented, and the results are compared. The mean of the variances of the Sc2O3refractive-index determinations in the 0.40–0.75-nm spectral region was 0.03. The corresponding variances for the refractive index and absorption coefficient of Rh were 0.35 and 0.26, respectively.
Three-Reflection Halfwave And Quarterwave Retarders Using Dielectric-Coated Metallic Mirrors, T. F. Thonn, R. M.A. Azzam
Three-Reflection Halfwave And Quarterwave Retarders Using Dielectric-Coated Metallic Mirrors, T. F. Thonn, R. M.A. Azzam
Electrical Engineering Faculty Publications
A design procedure is described to determine the thicknesses of single-layer coatings of a given dielectric on a given metallic substrate so that a specified net phase retardance (and/or a net relative amplitude attenuation) between the p and s polarizations is achieved after three reflections from a symmetrical arrangement of three mirrors that maintain collinearity of the input and output beams. Examples are presented of halfwave and quarterwave retarders (HWR and QWR) that use a ZnS-Ag film-substrate system at the CO2-laser wavelength λ = 10.6 µm. The equal net reflectances for the p and s polarizations are computed …
Inverting The Ratio Of The Complex Parallel And Perpendicular Reflection Coefficients Of An Absorbing Substrate Using A Transparent Thin-Film Coating, R. M.A. Azzam
Electrical Engineering Faculty Publications
An absorbing substrate can be coated with a transparent thin film of refractive index N1 (within a certain range) and thickness d such that the ratio of complex reflection coefficients for the p_and s polarizations of the film-covered substrate ρ = Rp/Rs is the inverse of that of the film-free substrate ρ¯ = R¯p/R¯s at an angle of incidence ø. A method to determine the relationship among ø, N1, and d that inverts ρ (i.e., makes ρ = 1/ρ¯) for a given substrate at a given wavelength is described and is …
Division-Of-Wave-Front Polarizing Beam Splitter And Half-Shade Device Using Dielectric Thin Film On Dielectric Substrate, R. M.A. Azzam
Division-Of-Wave-Front Polarizing Beam Splitter And Half-Shade Device Using Dielectric Thin Film On Dielectric Substrate, R. M.A. Azzam
Electrical Engineering Faculty Publications
No abstract provided.