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Scanning Probe Microscopy Studies Of The Properties Of Conducting Polymers, Kevin D. O'Neil
Scanning Probe Microscopy Studies Of The Properties Of Conducting Polymers, Kevin D. O'Neil
Electronic Thesis and Dissertation Repository
Electronically conducting polymers (ECPs) have been growing in interest as important materials for a variety of different applications such as charge storage devices and photovoltaics. However, in all of these applications, the performance of conducting polymers are strongly dependent upon their local properties such as morphology, local conductivity and carrier mobility, local chemical composition, etc. All polymer materials feature a distribution of these parameters and therefore, they are considered heterogeneous. In this work, we use atomic force microscopy (AFM) and its related techniques such as current-sensing AFM (CS-AFM), Kelvin probe force microscopy (KFM) and phase imaging (PI-AFM) to directly investigate …