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Analytical Modeling And Characterization For Avalanche Photodiodes, Erum Jamil

Optical Science and Engineering ETDs

For applications requiring the detection of low light levels, avalanche photodiodes (APDs) are the preferred detector of choice. The reason for this is their internal gain, which improves the APDs sensitivity (up to 5 − 10 dB) when compared to PIN-based photodiodes. The internal gain for an APD comes from the process of impact ionization process; however, due to its stochastic nature, the multiplication gain comes at the expense of extra noise. This multiplication noise, called the excess noise, is a measure of the gain uncertainty. Despite significant progress made in the fabrication process for the APDs, the excess noise …