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Full-Text Articles in Operations Research, Systems Engineering and Industrial Engineering
A Heuristic Algorithm To Generate Test Program Sequences For Moving Probe Electronic Test Equipment, Bertha M. Arteta
FIU Electronic Theses and Dissertations
The electronics industry, is experiencing two trends one of which is the drive towards miniaturization of electronic products. The in-circuit testing predominantly used for continuity testing of printed circuit boards (PCB) can no longer meet the demands of smaller size circuits. This has lead to the development of moving probe testing equipment. Moving Probe Test opens up the opportunity to test PCBs where the test points are on a small pitch (distance between points). However, since the test uses probes that move sequentially to perform the test, the total test time is much greater than traditional in-circuit test. While significant ...