Operations Research, Systems Engineering and Industrial Engineering Commons^™

Reliability Analysis Of Nanocrystal Embedded High-K Nonvolatile Memories, Chia-Han Yang

Doctoral Dissertations

The evolution of the MOSFET technology has been driven by the aggressive shrinkage of the device size to improve the device performance and to increase the circuit density. Currently, many research demonstrated that the continuous polycrystalline silicon film in the floating-gate dielectric could be replaced with nanocrystal (nc) embedded high-k thin film to minimize the charge loss due to the defective thin tunnel dielectric layer.

This research deals with both the statistical aspect of reliability and electrical aspect of reliability characterization as well. In this study, the Zr-doped HfO₂ (ZrHfO) high-k MOS capacitors, which separately contain the nanocrystalline zinc …

Birnbaum Importance Patterns And Their Applications In The Component Assignment Problem, Qingzhu Yao

Doctoral Dissertations

The Birnbaum importance (BI) is a well-known measure that evaluates the relative contribution of components to system reliability. It has been successfully applied to tackling some reliability problems. This dissertation investigates two topics related to the BI in the reliability field: the patterns of component BIs and the BI-based heuristics and meta-heuristics for solving the component assignment problem (CAP).

There exist certain patterns of component BIs (i.e., the relative order of the BI values to the individual components) for linear consecutive-k-out-of-n (Lin/Con/k/n) systems when all components have the same reliability p. This study summarizes …