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The Measurement Of Magnetostriction Constants Of Thin Films Using Planar Microwave Devices And Ferromagnetic Resonance, S. E. Bushnell, W. B. Nowak, S. A. Oliver, C. Vittoria

Carmine Vittoria

In this paper we introduce a new technique for measuring the saturation magnetostriction constant (λs) for isotropic polycrystalline thin films. The technique makes use of nonresonant planar microwave structures together with a novel stressing mechanism to induce a shift in the resonant field of a magnetic thin film as measured by a ferromagnetic resonance (FMR) experiment. Measurement of the shift induced by a uniaxial stress allows for determination of λs via a magnetic resonance analysis. Either a slotline device or coplanar waveguide (CPW) was used as the source of the microwave excitation field depending upon the orientation of the dc …