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Full-Text Articles in Operations Research, Systems Engineering and Industrial Engineering
A Preliminary Model For Lot Sizing In Semiconductor Manufacturing, Tali F. Carmon, Steven Nahmias
A Preliminary Model For Lot Sizing In Semiconductor Manufacturing, Tali F. Carmon, Steven Nahmias
Industrial and Manufacturing Engineering
No abstract provided.
Error Recovery In Intelligent Robotic Workcells, R. D. Borchelt, Sema E. Alptekin
Error Recovery In Intelligent Robotic Workcells, R. D. Borchelt, Sema E. Alptekin
Industrial and Manufacturing Engineering
This paper focuses on the requirements for achieving automated diagnosis and error recovery in a robotic assembly cell. Untended robust operation is the goal which is discussed, and the use of a knowledge-base oriented diagnostic/control system to support on-line error recovery is advocated. It is proposed that error recovery attempts should be made, not only based on information gathered by system sensors, but also by using additional cell-specific knowledge pertaining to recovery strategies. Recovery attempts are to be made even in the absence of complete diagnosis, in order to gather additional information. A control structure developed to implement this approach …
The Importance Of Considering Size Effect Along The Cutting Edge In Predicting The Effective Lead Angle For Turning, William J. Endres, Daniel Waldorf
The Importance Of Considering Size Effect Along The Cutting Edge In Predicting The Effective Lead Angle For Turning, William J. Endres, Daniel Waldorf
Industrial and Manufacturing Engineering
The concept of an effective orthogonal cutting edge in turning is considered. The orientation of this edge in the radial-longitudinal plane, as commonly modeled through an effective lead angle, is studied. The methods of effective lead angle prediction used in numerous previously developed force models are plagued with large errors over ranges of process inputs, in particular feed rate and depth of cut. Four previously developed methods of effective lead angle prediction are reviewed and compared to a new method presented here. This new method accounts for the size effect as introduced through the variation in chip thickness along the …