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Full-Text Articles in Nanoscience and Nanotechnology

Determining The Electronic Properties Of Individual Nanointerfaces By Combining Intermittent Afm Imaging And Contact Spectroscopy, Ramsey A. Kraya, Dawn A. Bonnell Nov 2010

Determining The Electronic Properties Of Individual Nanointerfaces By Combining Intermittent Afm Imaging And Contact Spectroscopy, Ramsey A. Kraya, Dawn A. Bonnell

Departmental Papers (MSE)

A method to determine the electronic properties at nanointerfaces or of nanostructures by utilizing intermittent contact atomic force microscopy and contact spectroscopy in one system is developed. By combining these two methods, the integrity of the interface or structure is maintained during imaging, while the extraction of the electronic information is obtained with contact spectroscopy. This method is especially vital for understanding interfaces between metal nanoparticles and substrates, where the nanoparticles are not tethered to the surface and can be combined with new and evolving techniques of thermal drift compensation to allow for a larger range of experiments on nanointerfaces ...


Accurate Force Spectroscopy In Tapping Mode Atomic Force Microscopy In Liquids, Xin Xu, John Melcher, Arvind Raman Jan 2010

Accurate Force Spectroscopy In Tapping Mode Atomic Force Microscopy In Liquids, Xin Xu, John Melcher, Arvind Raman

Birck and NCN Publications

Existing force spectroscopy methods in tapping mode atomic force microscopy (AFM) such as higher harmonic inversion [M. Stark, R. W. Stark, W. M. Heckl, and R. Guckenberger, Proc. Natl. Acad. Sci. U. S. A. 99, 8473 (2002)] or scanning probe acceleration microscopy [J. Legleiter, M. Park, B. Cusick, and T. Kowalewski, Proc. Natl. Acad. Sci. U. S. A. 103, 4813 (2006)] or integral relations [M. Lee and W. Jhe, Phys. Rev. Lett. 97, 036104 (2006); S. Hu and A. Raman, Nanotechnology 19, 375704 (2008); H. Holscher, Appl. Phys. Lett. 89, 123109 (2006); A. J. Katan, Nanotechnology 20, 165703 (2009)] require ...


An Alternative Method To Determining Optical Lever Sensitivity In Atomic Force Microscopy Without Tip-Sample Contact, Christopher J. Tourek, Sriram Sundararajan Jan 2010

An Alternative Method To Determining Optical Lever Sensitivity In Atomic Force Microscopy Without Tip-Sample Contact, Christopher J. Tourek, Sriram Sundararajan

Mechanical Engineering Publications

Force studies using atomic force microscopy generally require knowledge of the cantilever spring constants and the optical lever sensitivity. The traditional method of evaluating the optical lever sensitivity by pressing the tip against a hard surface can damage the tip, especially sharp ones. Here a method is shown to calculate the sensitivity without having to bring the tip into contact. Instead a sharpened tungsten wire is used to cause a point contact directly onto the cantilever and cause cantilever bending. Using beam theory, the sensitivity thus found can be converted to the equivalent sensitivity that would be obtained using the ...