Open Access. Powered by Scholars. Published by Universities.®

Nanoscience and Nanotechnology Commons

Open Access. Powered by Scholars. Published by Universities.®

Articles 1 - 2 of 2

Full-Text Articles in Nanoscience and Nanotechnology

Atom Scale Characterization Of The Near Apex Region Of An Atomic Force Microscope Tip, Christopher J. Tourek, Sriram Sundararajan Oct 2010

Atom Scale Characterization Of The Near Apex Region Of An Atomic Force Microscope Tip, Christopher J. Tourek, Sriram Sundararajan

Mechanical Engineering Publications

Three-dimensional atom probe tomography (APT) is successfully used to analyze the near-apex regions of an atomic force microscope (AFM) tip. Atom scale material structure and chemistry from APT analysis for standard silicon AFM tips and silicon AFM tips coated with a thin film of Cu is presented. Comparison of the thin film data with that observed using transmission electron microscopy indicates that APT can be reliably used to investigate the material structure and chemistry of the apex of an AFM tip at near atomic scales.


An Alternative Method To Determining Optical Lever Sensitivity In Atomic Force Microscopy Without Tip-Sample Contact, Christopher J. Tourek, Sriram Sundararajan Jan 2010

An Alternative Method To Determining Optical Lever Sensitivity In Atomic Force Microscopy Without Tip-Sample Contact, Christopher J. Tourek, Sriram Sundararajan

Mechanical Engineering Publications

Force studies using atomic force microscopy generally require knowledge of the cantilever spring constants and the optical lever sensitivity. The traditional method of evaluating the optical lever sensitivity by pressing the tip against a hard surface can damage the tip, especially sharp ones. Here a method is shown to calculate the sensitivity without having to bring the tip into contact. Instead a sharpened tungsten wire is used to cause a point contact directly onto the cantilever and cause cantilever bending. Using beam theory, the sensitivity thus found can be converted to the equivalent sensitivity that would be obtained using the ...