Nanoscience and Nanotechnology Commons^™

Synthesis And Characterization Of Highly Textured Pt–Bi Thin Films, Xingzhong Li, Parashu Kharel, Shah R. Valloppilly, David J. Sellmyer

Nebraska Center for Materials and Nanoscience: Faculty Publications

Pt–Bi films were synthesized on glass and thermally oxidized silicon substrates by e-beam evaporation and annealing. The structures were characterized using X-ray diffraction (XRD) and transmission electron microscopy/selected area electron diffraction (TEM/SAED) techniques. Single-phase PtBi was obtained at an annealing temperature of 300°C, whereas a higher annealing temperature of 400°C was required to obtain the highly textured γ-PtBi2 phase. TEM/SAED analysis showed that the films annealed at 400°C contain a dominant γ-PtBi2 phase with a small amount of β-PtBi2 and α-PtBi2 phases. Both the PtBi and γ-PtBi2 phases are highly textured in these two kinds of film: the c-axis of …

Pced2.0—A Computer Program For The Simulation Of Polycrystalline Electron Diffraction Pattern, Xingzhong Li

Nebraska Center for Materials and Nanoscience: Faculty Publications

A computer program for the simulation of polycrystalline electron diffraction patterns is described. PCED2.0, an upgraded version of the previous JECP/PCED, can be used as a teaching aid and research tool for phase identification, microstructure texture analysis, and phase fraction determination. In addition to kinematical theory for diffraction intensity calculation of polycrystalline samples, Blackman two-beam dynamical correction is included. March model is used for out-of-plane and in-plane texture simulation. A pseudo-Voigt function is used for the peak profile fitting of diffraction rings. User-friendly interface is improved in the handling of experimental diffraction data and the flexibility of indexing. Application of …

Jecp/Holz — An Interactive Computer Program For Simulation Of Holz Patterns, Xingzhong Li

Nebraska Center for Materials and Nanoscience: Faculty Publications

In the present work, an interactive computer program for simulation of the HOLZ line patterns, JECP/HOLZ, is reported. A feature of this program is the integration of the simulation of the HOLZ reflections and the HOLZ (curved and straight) lines, which is interactive with respect to changes of the lattice parameter, the accelerator voltage, the zone axis, and the beam tilt. The program can be used as a teaching aid for students as well as a tool for scientists working on electron diffraction experiments.

Jecp/Ed — A Computer Program For Simulation Of Selected-Area And Precession Electron Diffraction Patterns, Xingzhong Li

Nebraska Center for Materials and Nanoscience: Faculty Publications

Crystal structure determination by electron crystallography has been very successful in many fields, ranging from organic to inorganic materials. Collection of electron diffraction data is still a crucial step in electron crystallography. The curvature of the Ewald sphere limits the data available in each electron diffraction pattern. The dynamical multi-scattering effect of electron diffraction increases the complexity of the structure determination procedure.

A precession method (Vincent & Midgley, 1994) has been used to solve the crystal structure of AlmFe by Gjonnes and coworker (Berg et al., 1998; Gjonnes et al., 1998). The advantages of precession electron diffraction are (i) the …