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An Alternative Method To Determining Optical Lever Sensitivity In Atomic Force Microscopy Without Tip-Sample Contact, Christopher J. Tourek, Sriram Sundararajan Jan 2010

An Alternative Method To Determining Optical Lever Sensitivity In Atomic Force Microscopy Without Tip-Sample Contact, Christopher J. Tourek, Sriram Sundararajan

Mechanical Engineering Publications

Force studies using atomic force microscopy generally require knowledge of the cantilever spring constants and the optical lever sensitivity. The traditional method of evaluating the optical lever sensitivity by pressing the tip against a hard surface can damage the tip, especially sharp ones. Here a method is shown to calculate the sensitivity without having to bring the tip into contact. Instead a sharpened tungsten wire is used to cause a point contact directly onto the cantilever and cause cantilever bending. Using beam theory, the sensitivity thus found can be converted to the equivalent sensitivity that would be obtained using the ...