Open Access. Powered by Scholars. Published by Universities.®

Nanoscience and Nanotechnology Commons

Open Access. Powered by Scholars. Published by Universities.®

Mechanical Engineering

Mechanical Engineering Publications

Atomic force microscope (AFM)

Articles 1 - 1 of 1

Full-Text Articles in Nanoscience and Nanotechnology

Atom Scale Characterization Of The Near Apex Region Of An Atomic Force Microscope Tip, Christopher J. Tourek, Sriram Sundararajan Oct 2010

Atom Scale Characterization Of The Near Apex Region Of An Atomic Force Microscope Tip, Christopher J. Tourek, Sriram Sundararajan

Mechanical Engineering Publications

Three-dimensional atom probe tomography (APT) is successfully used to analyze the near-apex regions of an atomic force microscope (AFM) tip. Atom scale material structure and chemistry from APT analysis for standard silicon AFM tips and silicon AFM tips coated with a thin film of Cu is presented. Comparison of the thin film data with that observed using transmission electron microscopy indicates that APT can be reliably used to investigate the material structure and chemistry of the apex of an AFM tip at near atomic scales.