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Study On The Surface States Of Zinc Sulfide Thin Film Doped With Erbium And Their Effect On The Relaxation Luminance, Yujiang Wang, Zhaohong Liu, Zhenxiang Chen

Journal of Electrochemistry

X-ray photoelectron spectrum and characteristics of the capacity,versus thevoltage of the thin film devices are measured to study the surface states of the zinc sulfide thin film.The transient electroluminescence excited by pulses shows the relaxation luminance peaks during anon-exponential decay process of the characteristic transitions activated by Er￣(3+) in the ZnS directcurrent thin film electroluminescence (DCTFEL) devices.The surface structures of ZnS:Cu,Cl,Erfilm with the absorption of oxygen,and the effect of the surface states on the relaxation luminance ofthe devices are discussed.