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Reliability Assessment Of Ion Contamination Residues On Printed Circuit Board, Minh Tam Tran Nguyen
Reliability Assessment Of Ion Contamination Residues On Printed Circuit Board, Minh Tam Tran Nguyen
USF Tampa Graduate Theses and Dissertations
Ion contaminants from Printed Circuit Board (PCB) assembly processes pose a high reliability risk because they result in damaged circuits. Therefore, it is essential to understand the level of ionic species on the electronic circuitry as well as the reliability risks caused by these contaminants. There are a number of approaches available in the industry to assess the reliability risks ; for example, the water drop test (WDT) is one of the techniques used to determine the propensity of an ionic contaminant to cause electrical short failures by dendrite formation. The objective of this research is to determine the time …