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Reflection electron diffraction

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Full-Text Articles in Mechanical Engineering

Magnetic And Microwave Properties Of Ion-Beam-Sputtered Amorphous FeₓCo₈₀₋ₓB₁₅Si₅ Films, V. G. Harris, S. A. Oliver, W. B. Nowak, C. Vittoria Jun 2011

Magnetic And Microwave Properties Of Ion-Beam-Sputtered Amorphous FeₓCo₈₀₋ₓB₁₅Si₅ Films, V. G. Harris, S. A. Oliver, W. B. Nowak, C. Vittoria

Carmine Vittoria

Magnetically soft amorphous films of FeₓCo₈₀₋ₓB₁₅Si₅ (x = 0, 6, 23, 40, 70, 80) were ion beam sputter deposited onto fused quartz for static and microwave magnetic characterization. Films ranged in thickness from 220 to 260 nm and were deposited at rates of 0.1-0.2 nm/s. Saturation magnetization, coercivity, and loop squareness values were extracted from hysteresis loops generated by a vibrating sample magnetometer. Ferromagnetic resonance measurements were taken using a 9.5-GHz cavity with the applied magnetic field both parallel and perpendicular to the plane of the film, yielding values for the g factor, anisotropy field, effective ...


Magnetic And Microwave Properties Of Ion-Beam-Sputtered Amorphous FeₓCo₈₀₋ₓB₁₅Si₅ Films, V. G. Harris, S. A. Oliver, W. B. Nowak, C. Vittoria Apr 2011

Magnetic And Microwave Properties Of Ion-Beam-Sputtered Amorphous FeₓCo₈₀₋ₓB₁₅Si₅ Films, V. G. Harris, S. A. Oliver, W. B. Nowak, C. Vittoria

Vincent G. Harris

Magnetically soft amorphous films of FeₓCo₈₀₋ₓB₁₅Si₅ (x = 0, 6, 23, 40, 70, 80) were ion beam sputter deposited onto fused quartz for static and microwave magnetic characterization. Films ranged in thickness from 220 to 260 nm and were deposited at rates of 0.1-0.2 nm/s. Saturation magnetization, coercivity, and loop squareness values were extracted from hysteresis loops generated by a vibrating sample magnetometer. Ferromagnetic resonance measurements were taken using a 9.5-GHz cavity with the applied magnetic field both parallel and perpendicular to the plane of the film, yielding values for the g factor, anisotropy field, effective ...


Magnetic And Microwave Properties Of Ion-Beam-Sputtered Amorphous FeₓCo₈₀₋ₓB₁₅Si₅ Films, V. G. Harris, S. A. Oliver, W. B. Nowak, C. Vittoria Dec 2010

Magnetic And Microwave Properties Of Ion-Beam-Sputtered Amorphous FeₓCo₈₀₋ₓB₁₅Si₅ Films, V. G. Harris, S. A. Oliver, W. B. Nowak, C. Vittoria

Welville B. Nowak

Magnetically soft amorphous films of FeₓCo₈₀₋ₓB₁₅Si₅ (x = 0, 6, 23, 40, 70, 80) were ion beam sputter deposited onto fused quartz for static and microwave magnetic characterization. Films ranged in thickness from 220 to 260 nm and were deposited at rates of 0.1-0.2 nm/s. Saturation magnetization, coercivity, and loop squareness values were extracted from hysteresis loops generated by a vibrating sample magnetometer. Ferromagnetic resonance measurements were taken using a 9.5-GHz cavity with the applied magnetic field both parallel and perpendicular to the plane of the film, yielding values for the g factor, anisotropy field, effective ...