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Missouri University of Science and Technology

2011

Masters Theses

<p>Atomic force microscopy<br />Image processing -- Mathematical models<br />Surfaces (Technology) -- Analysis</p>

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Full-Text Articles in Mechanical Engineering

Bi-Harmonic Atomic Force Microscopy, Santosh R. Kodandarama Jan 2011

Bi-Harmonic Atomic Force Microscopy, Santosh R. Kodandarama

Masters Theses

"In tapping mode atomic force microscopy, surface features are measured indirectly via the amplitude of the tapping cantilever. A change in surface profile is detectable only if it results in an amplitude change that is significant enough to be measured by the optics. Previous works have focused on improving sensitivity through the system's Q-factor, either by changing physical cantilever properties or using feedback control, but those approaches undesirably slow down the dynamic response. In this work we take a novel approach to sensitivity amplification by reshaping the tapping trajectory. By shaping the trajectory so that the probe spends a ...