Open Access. Powered by Scholars. Published by Universities.®

Engineering Science and Materials Commons

Open Access. Powered by Scholars. Published by Universities.®

2009

Nanoscience and Nanotechnology

Dynamic atomic force microscopy

Articles 1 - 1 of 1

Full-Text Articles in Engineering Science and Materials

Identification Of Multiple Oscillation States Of Carbon Nanotube Tipped Cantilevers Interacting With Surfaces In Dynamic Atomic Force Microscopy, Mark Strus, Arvind Raman Jan 2009

Identification Of Multiple Oscillation States Of Carbon Nanotube Tipped Cantilevers Interacting With Surfaces In Dynamic Atomic Force Microscopy, Mark Strus, Arvind Raman

Birck and NCN Publications

Carbon nanotubes (CNTs) have gained increased interest in dynamic atomic force microscopy (dAFM) as sharp, flexible, conducting, nonreactive tips for high-resolution imaging, oxidation lithography, and electrostatic force microscopy. By means of theory and experiments we lay out a map of several distinct tapping mode AFM oscillation states for CNT tipped AFM cantilevers: namely, noncontact attractive regime oscillation, intermittent contact with CNT slipping or pinning, or permanent contact with the CNT in point or line contact with the surface while the cantilever oscillates with large amplitude. Each state represents fundamentally different origins of CNT-surface interactions, CNT tip-substrate dissipation, and phase contrast ...