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Engineering Science and Materials Commons

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Dissertations, Master's Theses and Master's Reports - Open

2010

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Full-Text Articles in Engineering Science and Materials

Investigation Into The Impact Of Grain Boundaries, Film Interface, And Crystallographic Orientation On The Ionic Conductivity Of Thin Film Gadolinium-Doped Ceria, Matthew M. Swanson Jan 2010

Investigation Into The Impact Of Grain Boundaries, Film Interface, And Crystallographic Orientation On The Ionic Conductivity Of Thin Film Gadolinium-Doped Ceria, Matthew M. Swanson

Dissertations, Master's Theses and Master's Reports - Open

The research reported in this dissertation investigates the impact of grain boundaries, film interface, and crystallographic orientation on the ionic conductivity of thin film Gd-doped CeO2 (GDC).

Chapter 2 of this work addresses claims in the literature that submicron grain boundaries have the potential to dramatically increase the ionic conductivity of GDC films. Unambiguous testing of this claim requires directly comparing the ionic conductivity of single-crystal GDC films to films that are identical except for the presence of submicron grain boundaries. In this work techniques have been developed to grow GDC films by RF magnetron sputtering from a GDC target ...


Measuring The Elastic Modulus Of Polymers Using The Atomic Force Microscope, Daniel Hoffman Jan 2010

Measuring The Elastic Modulus Of Polymers Using The Atomic Force Microscope, Daniel Hoffman

Dissertations, Master's Theses and Master's Reports - Open

Testing a new method of nanoindentation using the atomic force microscope (AFM) was the purpose of this research. Nanoindentation is a useful technique to study the properties of materials on the sub-micron scale. The AFM has been used as a nanoindenter previously; however several parameters needed to obtain accurate results, including tip radius and cantilever sensitivity, can be difficult to determine. To solve this problem, a new method to determine the elastic modulus of a material using the atomic force microscope (AFM) has been proposed by Tang et al. This method models the cantilever and the sample as two springs ...