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2x-Thru, 1x-Reflection, And Thru-Line De-Embedding: Theory, Sensitivity Analysis, And Error Corrections, Bichen Chen

Doctoral Dissertations

"Due to the simplicity of design and measurement, as well as the accuracy of results, the 2X-Thru de-embedding (2XTD), 1X-Reflection de-embedding (1XRD), and Thru-Line de-embedding (TLD) have been replaced the traditional de-embedding algorithms, such as TRL and SOLT. In this dissertation, theory of 2ⁿ-port 2XTD, 1XRD, and TLD are completely derived first. The self-error reduction schemes is introduced to mitigate the de-embedding errors due to non-ideal manufacturing effects of non-zero mode conversion terms, as well as the asymmetric, and manufacturing variations. The validations are performed on both theory and self-error reduction through simulation and measurements cases. The 2X-Thru …