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Full-Text Articles in Engineering
Single-Element Rotating-Polarizer Ellipsometer For Film-Substrate Systems, A.-R. M. Zaghloul, R. M.A. Azzam
Single-Element Rotating-Polarizer Ellipsometer For Film-Substrate Systems, A.-R. M. Zaghloul, R. M.A. Azzam
Electrical Engineering Faculty Publications
A novel and very simple ellipsometer for the characterization of film-substrate systems that employs one rotating optical element (a polarizer) is proposed. The ellipsometer is based on detecting the angles of incidence at which a film-substrate system has equal amplitude attenuations for light polarized parallel (p) and perpendicular (s) to the plane of incidence. At a certain wavelength, the film thickness of the filmsubstrate system has to lie within permissible-thickness bands (PTB) for the technique to apply.
Sio2-Si Film-Substrate Reflection Polarizers For Different Mercury Spectral Lines, A.-R. M. Zaghloul, R. M.A. Azzam
Sio2-Si Film-Substrate Reflection Polarizers For Different Mercury Spectral Lines, A.-R. M. Zaghloul, R. M.A. Azzam
Electrical Engineering Faculty Publications
No abstract provided.