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<p>Automatic data collection systems -- Design<br />Electric currents -- Measurement<br />Semiconductors -- Testing</p>
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An Automatic Data Acquisition System For Semiconductor Device Testing, Donald L. Bartling
An Automatic Data Acquisition System For Semiconductor Device Testing, Donald L. Bartling
Masters Theses
"An Automatic Data Acquisition System for determining the Voltage/Current characteristics of semiconductor devices is presented. The system is capable of measuring currents in the range from 10-10 amperes to 200 milliamperes. The system includes various pieces of commercially available equipment plus several pieces of specially designed and fabricated equipment.
The system yields a maximum of 59 data points each for both the base and collector characteristics of the transistor tested. The system is designed to perform a particular sequence of events. These events are controlled by a specially designed and fabricated piece of equipment called the Control Center.
The …