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Stochastic Worst-Case Test Vectors For Asic Devices In Single Event Environment, Mostafa Hemeda

Theses and Dissertations

Charged particles and energetic particles can impact the integrated circuit, referred to as single event effects (SEE). Nuclear reactors and space radiation can produce these particles. These effects can negatively affect the reliability and performance of electronics. When SEE occurs, a transient current is created, which can cause electronic devices to have incorrect outputs and ultimately fail. As a result, ensuring the reliability of ASIC circuits is a significant concern.

This thesis discusses the different fault types, then discuss the soft error and, in particular, the Single Event Transient (SET) and its causes and models. Then, this thesis proposes a …