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Stability Studies Of Cdte/Cds Thin Film Solar Cells, Bhaskar Reddy Tetali
Stability Studies Of Cdte/Cds Thin Film Solar Cells, Bhaskar Reddy Tetali
USF Tampa Graduate Theses and Dissertations
CdTe/CdS solar cells have shown great potential for terrestrial solar power applications. To be commercially viable they need to operate efficiently for about 30 years. CdS/CdTe solar cells fabricated at USF have shown record efficiencies upto 16.5% [46]. This research involves the study of thermal stress (TS) and light soaking (LS) on the stability of high efficiency (>10%) solar cells. The change in key electrical parameters Voc, FF, Jsc, A and Jo are quantified for more than 2000 hours of stressing.
The device degradation was found to increase with stress temperature for TS. Below …
Growth And Characterization Of Diamond And Diamond Like Carbon Films With Interlayer, Roja Gottimukkala
Growth And Characterization Of Diamond And Diamond Like Carbon Films With Interlayer, Roja Gottimukkala
USF Tampa Graduate Theses and Dissertations
Diamond and diamond-like carbon films, with their exceptionally good mechanical, chemical, and optical properties, are the best materials as protective hard coatings for electronic devices and cutting tools. The biocompatibility of these materials makes it suitable for bone implants. The wide range applications of these films are hindered because of the high compressive stresses developed during the deposition. Use of carbide and nitride interfacial layers has emerged as one of the methods to reduce the compressive stresses.
The present research focuses on the study of different materials as the interfacial layers for diamond and tetrahedral amorphous carbon films. For tetrahedral …
Stress Diagnostics And Crack Detection In Full-Size Silicon Wafers Using Resonance Ultrasonic Vibrations, Anton Byelyayev
Stress Diagnostics And Crack Detection In Full-Size Silicon Wafers Using Resonance Ultrasonic Vibrations, Anton Byelyayev
USF Tampa Graduate Theses and Dissertations
Non-destructive monitoring of residual elastic stress in silicon wafers is a matter of strong concern for modern photovoltaic industry. The excess stress can generate cracks within the crystalline structure, which further may lead to wafer breakage. Cracks diagnostics and reduction in multicrystalline silicon, for example, are ones of the most important issues in photovoltaics now. The industry is intent to improve the yield of solar cells fabrication. There is a number of techniques to measure residual stress in semiconductor materials today. They include Raman spectroscopy, X-ray diffraction and infrared polariscopy. None of these methods are applicable for in-line diagnostics of …