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Investigation Of Fast Interface States In Mosfets Using A Pulsed Field Effect Technique, Anthony E. Giraudo
Investigation Of Fast Interface States In Mosfets Using A Pulsed Field Effect Technique, Anthony E. Giraudo
Electrical and Computer Engineering ETDs
This thesis is the culmination of an investigation into the pulsed field effect technique. Basically, the pulsed field effect technique is a measurement of the surface conductance of a semiconductor under the influence of a transverse electric field. The pulsed field effect has been used to investigate surface states and interface states at the silicon surface. The nature of this technique allows it to be used in analyzing the metal-oxide-semiconductor field effect transistor (MOSFET). Specifically, the investigation has been to determine if the pulsed field effect technique could be used to investigate fast interface states which are located at the …
A Time-Independent Laser Interferometry System For Measuring Velocities Of Any Relecting Surface, Robert A. Lederer
A Time-Independent Laser Interferometry System For Measuring Velocities Of Any Relecting Surface, Robert A. Lederer
Electrical and Computer Engineering ETDs
The development of the Dual Detector Velocity Interferometer System for Any Reflector (VI SAR) provides an effective instrumentation tool for measurement of specimens moving at high velocities without adding mass or causing extraneous resonances that are commonly encountered in the instrumentation process. The development of this instrument is the logical extension of the basic Velocity Interferometry System developed in 1972. The extension consists of introducing a dual detector system to eliminate ambiguous data, adding digitizers to record data, and adding a data reduction system to interpret the recorded data and recover a time velocity history of the specimen action. In …