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An Analysis Of The Use Of Rademacher-Walsh Spectrum In Compact Testing, Ten-Chuan Hsiao, Sharad C. Seth
An Analysis Of The Use Of Rademacher-Walsh Spectrum In Compact Testing, Ten-Chuan Hsiao, Sharad C. Seth
School of Computing: Faculty Publications
Earlier approaches to random compact testing use a random pattern generator which depends on the combinational function under test and a circuit signature which remains the same independent of the circuit. In this correspondence we analyze the performance of a new scheme in which the pattern generator is simple and independent of the function being tested but the circuit signature is chosen to be a coefficient from the Rademacher-Walsh (RW) spectrum of the function under test. The analysis provides guidelines for choosing an RW coefficient, a test length, and an error tolerance so as to minimize the probabilities of rejecting …
Characterizing The Lsi Yield Equation From Wafer Test Data, Sharad C. Seth, Vishwani D. Agrawal
Characterizing The Lsi Yield Equation From Wafer Test Data, Sharad C. Seth, Vishwani D. Agrawal
School of Computing: Faculty Publications
The results of production test on LSI wafers are analyzed to determine the parameters of the yield equation. Recognizing that a physical defect on a chip can produce several logical faults, the number of faults per defect is assumed to be a random variable with Poisson distribution. The analysis provides a relationship between the yield of the tested fraction of -the chip area and the cumulative fault coverage of test patterns. The parameters of the yield equation are estimated by fitting this relation to the measured yield versus fault coverage data.