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<p>Electromagnetic measurements<br />Integrated circuits -- Design<br />Near-fields -- Measurement</p>
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Universal Electric And Magnetic Fields Analyzer System, Yong Cheh Ho
Universal Electric And Magnetic Fields Analyzer System, Yong Cheh Ho
Masters Theses
"Near-field probing is often used to measure the electric and magnetic fields above a printed circuit board (PCB) or integrated circuits (IC) chip in order to identify the sources and coupling paths of an electromagnetic interference (EMI) problem.
A wideband universal field analyzer was designed, built and tested in this thesis. The system is able to provide fast field scanning over a wide frequency range in lieu of its capabilities to measure multiple field components using a single probe design. Central to the system operation is the phase-shifting concept that provides wideband and wide- range phase-shifting.
The complete universal field …