Digital Commons Network^™

New Marked Point Process Models For Microscopy Images, Dae Woo Kim

Open Access Dissertations

In developing new materials, the characterization of microstructures is one of the key steps. To characterize the microstructure, many microscope modalities have been devised and improved over decades. With the increase in image resolution in the spatial and time domains, the amount of image data keeps increasing in the fields such as materials science and biomedical engineering. As a result, image processing plays a critical role in this era of science and technology. In materials image analysis, image segmentation and feature detection are considered very important.

The first part of this research aims to resolve the segmentation problem caused by …

Evaluation Of Strain Distortion Correction Protocol Using Scanning Electron Microscopy And Digital Image Correlation, Alexandra Mallory, Alberto Mello, Michael Sangid

The Summer Undergraduate Research Fellowship (SURF) Symposium

Scanning electron microscopy in combination with digital image correlation (SEM-DIC) is a useful technique for measuring strain in materials at the micro-scale. In particular, it can be used to identify micro-scale strain localizations that are the precursor to material failure. While SEM produces high resolution images of the microstructure, the images also contain a large amount of distortion that, during DIC, will result in distorted strain values that require correction. In this project, a nickel-based alloy underwent cyclic mechanical fatigue at three different high temperatures to a targeted maximum strain. Scanning electron microscopy imaging was done on a 200x150μm area …