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Vatdt: Visual Assessment Of Cluster Tendency Using Diagonal Tracing, Yingkang Hu
Vatdt: Visual Assessment Of Cluster Tendency Using Diagonal Tracing, Yingkang Hu
Yingkang Hu
The visual assessment of tendency (VAT) technique, for visually finding the number of meaningful clusters in data, developed by J. C. Bezdek, R. J. Hathaway and J. M. Huband, is very useful, but there is room for improvements. Instead of displaying the ordered dissimilarity matrix (ODM) as a 2D gray-level image for human interpretation as is done by VAT, we trace the changes in dissimilarities along the diagonal of the ODM. This changes the 2D data structure (matrices) into 1D arrays, displayed as what we call the tendency curves, which enables one to concentrate only on one variable, namely the …