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Materials Science and Engineering
Electrical and Computer Engineering Faculty Research & Creative Works
- Keyword
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- Corrosion Testing (2)
- Automotive (1)
- Corrosion and Pitting under Paint Detection and Evaluation (1)
- Coupling (1)
- Data Fusion (1)
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- Dielectric (1)
- Eddy Current Testing (1)
- Electromagnetic compatibility (1)
- Emissions (1)
- Integrated circuits (1)
- Maxwell Garnett (MG) Mixing Rule (1)
- Microwave Frequencies (1)
- Microwaves (1)
- Millimeter Waves (1)
- Nanorods (1)
- Nondestructive Evaluation (1)
- Nondestructive Testing (1)
- Optical Frequencies (1)
- Sensor Fusion (1)
- Structural Analysis (1)
Articles 1 - 4 of 4
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Application Of Chip-Level Emc In Automotive Product Design, Kuifeng Hu, H. Weng, Daryl G. Beetner, David Pommerenke, James L. Drewniak, K. Lavery, Jason Whiles
Application Of Chip-Level Emc In Automotive Product Design, Kuifeng Hu, H. Weng, Daryl G. Beetner, David Pommerenke, James L. Drewniak, K. Lavery, Jason Whiles
Electrical and Computer Engineering Faculty Research & Creative Works
Integrated circuits (ICs) are often the source of the high-frequency noise that drives electromagnetic emissions from electronic products. A case study is presented where emissions from a printed circuit board containing an automotive microcontroller are reduced significantly through analysis of the coupling mechanisms from the chip to the board and attached cables. Noise generated by the IC is explored through measurements in a semi-anechoic chamber and TEM cell, through near-field scans, and through modifications to the printed circuit board. Noise is driven by the IC through both power and I/O connections. Results show that a ferrite in series with I/O …
Fusion Of Microwave And Eddy Current Data For A Multi-Modal Approach In Evaluating Corrosion Under Paint And In Lap Joints, Kapil Gupta, Mohammad Tayeb Ahmad Ghasr, Sergey Kharkovsky, R. Zoughi, R. Joe Stanley, Ajay Padwal, Matthew O'Keefe, Donald D. Palmer, J. Blackshire, Gary Steffes, N. Wood
Fusion Of Microwave And Eddy Current Data For A Multi-Modal Approach In Evaluating Corrosion Under Paint And In Lap Joints, Kapil Gupta, Mohammad Tayeb Ahmad Ghasr, Sergey Kharkovsky, R. Zoughi, R. Joe Stanley, Ajay Padwal, Matthew O'Keefe, Donald D. Palmer, J. Blackshire, Gary Steffes, N. Wood
Electrical and Computer Engineering Faculty Research & Creative Works
Critical aircraft structures are susceptible to hidden corrosion. Find-it and fix-it approaches are inefficient as it relates to managing the problems associated with corrosion. More comprehensive corrosion information may be obtained using data fusion from several detection and evaluation methods. To this end, microwave, conventional and pulsed eddy current data from a multi-layer corroded panel, representing an aircraft lap joint, are fused and used as inputs to a structural analysis model to obtain a comprehensive snapshot of the corroded environment. This paper presents the data fusion algorithm and the structural analysis model along with a discussion of the results.
Millimeter Wave Imaging Of Corrosion Under Paint: Comparison Of Two Probes, Mohammad Tayeb Ahmad Ghasr, Sergey Kharkovsky, R. Zoughi, Matthew O'Keefe, Ajay Padwal, Donald D. Palmer
Millimeter Wave Imaging Of Corrosion Under Paint: Comparison Of Two Probes, Mohammad Tayeb Ahmad Ghasr, Sergey Kharkovsky, R. Zoughi, Matthew O'Keefe, Ajay Padwal, Donald D. Palmer
Electrical and Computer Engineering Faculty Research & Creative Works
Critical aircraft structures are susceptible to harsh environmental conditions that cause corrosion of these structural components. It is of great importance to detect corrosion under paint, particularly in its early stages. Millimeter wave nondestructive evaluation methods have shown great potential for detecting corrosion under paint and evaluating its properties. This paper presents and compares the results of using two distinct millimeter wave detection methods; namely a standard single probe and a newly developed differential probe for detecting corrosion under paint.
Modeling Of Dielectric Mixtures Containing Conducting Inclusions With Statistically Distributed Aspect Ratio, Marina Koledintseva, Sandeep K. R. Chandra, Richard E. Dubroff, Robert W. Schwartz
Modeling Of Dielectric Mixtures Containing Conducting Inclusions With Statistically Distributed Aspect Ratio, Marina Koledintseva, Sandeep K. R. Chandra, Richard E. Dubroff, Robert W. Schwartz
Electrical and Computer Engineering Faculty Research & Creative Works
An analytical model of composites made of a dielectric base and randomly oriented metal inclusions in the form of nanorods is presented. This model is based on the generalized Maxwell Garnett (MG) mixing rule. In this model, the nanorod particles are modeled as prolate spheroids with a statistically normal distribution of their aspect ratios. It is shown that parameters of the distribution laws affect the frequency characteristics of the composites both at microwave and optical frequencies. The results of computations are represented.