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1992

Utah State University

Electron diffraction

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Calcospherites In Rabbit Incisor Predentin, H. Mishima, Y. Kunuki, T. Sakae, Y. Kozawa, N. Watabe Dec 1992

Calcospherites In Rabbit Incisor Predentin, H. Mishima, Y. Kunuki, T. Sakae, Y. Kozawa, N. Watabe

Scanning Microscopy

Calcospherites from the lower incisor dentin of rabbits were investigated by scanning and transmission electron microscopy (TEM), energy dispersive spectroscopy (EDS) and electron diffraction analyses. In the labial predentin, globular calcospherites of 8-31 μm were present at the root apex, decreasing in size toward the incisal region. The calcospherites at the intermediate region were of mulberry- as well as of spindle-shape of 1.5-4 μm diameter. The incisal pulp horn contained micro-calcospherites of 0.3-0.6 μmin diameter. In the lingual predentin, small granular calcospherites of 1. 8-3 μm were present at the root apex, increasing in size toward the intermediate region. Ultrathin …


Strained And Relaxed Semiconducting Silicide Layers Heteroepitaxially Grown On Silicon, J. Chevrier, Le Thanh Vinh, J. Derrien Nov 1992

Strained And Relaxed Semiconducting Silicide Layers Heteroepitaxially Grown On Silicon, J. Chevrier, Le Thanh Vinh, J. Derrien

Scanning Microscopy

The semiconducting silicide ß-FeSi2, which can be grown epitaxially on silicon, is potentially an interesting material for integrated optoelectronic devices. Its semiconducting state stabilised by a solid state Jahn Teller effect is very unusual. Indeed the epitaxial growth of FeSi2 on silicon (111) in a Molecular Beam Epitaxy (MBE) chamber has revealed the existence of a metallic strained FeSi2 phase which is the result of a simultaneous electronic and structural transition. The stability and the relaxation of this strained phase which is specifically due to the epitaxy of FeSi2 on the silicon (111) face …


Image Processing Procedures For Analysis Of Electron Back Scattering Patterns, N. C. Krieger Lassen, D. Juul Jensen, K. Conradsen Mar 1992

Image Processing Procedures For Analysis Of Electron Back Scattering Patterns, N. C. Krieger Lassen, D. Juul Jensen, K. Conradsen

Scanning Microscopy

At present, computer-aided Electron Back Scattering Pattern (EBSP) analysis often requires large amounts of operator time if statistically reliable measurements are needed. This paper presents ways to automatically detect and localize bands in EBSPs and thereby enable fully automatic EBSP analysis. The main focus will be on a procedure using a modified Hough transform by which more than 12 bands in a typical EBSP can be detected and localized. This procedure seems as effective and reliable for extracting the bands of EBSPs as any human operator. The performance of this procedure is compared with that of other image processing procedures.


Application Of The Wavelet Transform To The Digital Image Processing Of Electron Micrographs And Of Backreflection Electron Diffraction Patterns, A. Gómez, L. Beltrán Del Río, D. Romeu, M. Jose Yacamán Jan 1992

Application Of The Wavelet Transform To The Digital Image Processing Of Electron Micrographs And Of Backreflection Electron Diffraction Patterns, A. Gómez, L. Beltrán Del Río, D. Romeu, M. Jose Yacamán

Scanning Microscopy

In this work we explore the use of the so-called wavelet transform in the digital image processing of micrographs. The wavelet transform of an image f(x,y) is defined as:

Wf(s,u,v)

= f(x,y) s Ψ(s(x-u),s(y-v)) dxdy

where Ψ is an analyzing function called "wavelet" and which is in our examples always taken to be the "Mexican hat" given by

Ψ(x)=(2-(x2+y2))exp(-(x2+y2)/2)

Some synthetic images are shown in which it can be clearly seen how the wavelet transform can be useful to reveal edges and to emphasize the boundaries of the clusters.

The technique is …


Phase Space Methods In Image Formation Theory, Victor Castaño, Gustavo Vásquez-Polo, Ramón Gutiérrez-Castrejón Jan 1992

Phase Space Methods In Image Formation Theory, Victor Castaño, Gustavo Vásquez-Polo, Ramón Gutiérrez-Castrejón

Scanning Microscopy

A review of the basic mathematical principles and properties of some phase space functions (Wigner and Ambiguity functions) is first presented in a more general mathematical context. Then, we deal in detail with three applications : image formation in optical systems (specifically cascading systems of lenses), image formation in Transmission Electron Microscopy, by taking advantage of some formal similarities with the previous examples and, finally, contrast transfer functions in Electron Microscopy in order to obtain 2-dimensional plots which provide information on the behavior of a transmission electron microscope. Also, the relations of these functions with other mathematical tools utilized in …