Digital Commons Network^™

Present Developments In Image Analysis, Peter Smart, Xiaoling Leng

Scanning Microscopy

The paper discusses novel methods of analysing oriented textures, explains some of the problems which had to be overcome to make these methods work, and indicates where future developments might be expected. This has required improvements in the methods of intensity gradient analysis, the development of large filter methods for mapping features defined in terms of their texture, and the introduction of ideas from the theory of regionalised variables.

The Effect Of Varying Environmental Conditions On Phytolith Morphometries In Two Species Of Grass (Bouteloua Curtipendula And Panicum Virgatum), T. B. Ball, J. D. Brotherson

Scanning Microscopy

Solid deposits of SiO₂ (phytoliths) accumulate in many plants in specific intracellular and extracellular locations. Phytoliths have morphological characteristics unique to some taxa and therefore have taxonomic significance. Phytoliths persist and maintain their morphological integrity long after a plant has died, thus becoming a microfossil of the plant that produced them. Development of phytolith sytematics for microfossil phytoliths has traditionally followed a typological approach based on simple verbal descriptions of shape. A new method for use in phytolith sytematics is the morphometric approach which employs computer-based Image Analysis Systems to make quantified measurements of morphological parameters (size, shape, texture, …

Quantitative Imaging Ion Microscopy: A Short Review, G. A. Valaskovic, G. H. Morrison

Scanning Microscopy

A short review of recent efforts being made in the quantification of images in ion microscopy is given. Special aspects of instrumentation, detection and acquisition, which are unique to direct imaging secondary ion mass spectrometry, are discussed in relation to the successful application of traditional empirical quantification schemes. Application of such quantification schemes requires proper sample preparation, standardization, analysis, and quite often, special techniques in image processing and the correlation of ion microscopy with other microscopies. Quantification within this technique is a difficult goal which can only be realized if the analyst pays strict attention to every step of the …

Some Applications Of Image Analysis To Materials Science, François Grillon

Scanning Microscopy

We have presented four applications of Image Analysis to material science. The first one is on a yarn composite SiC where we want to know the relative proportion of matrix, fibers, porosity and the size of the fibers. The results are used to estimate mechanical properties of the composite.

The second one is to measure the residual porosity after a laser shock on powder metallurgy steel. The knowledge of the depth of the affected zone is necessary to optimise the laser treatment.

The third one uses Fourier transformation to analyse plastic deformation on grains. Values are obtained from Fourier transform …

Processing Multi-Spectral Scanning Electron Microscopy Images For Quantitative Microfabric Analysis, N. K. Tovey, D. L. Dent, W. M. Corbett, D. H. Krinsley

Scanning Microscopy

Multi-spectral image analysis is a powerful method to characterise quantitatively the mineralogy and microfabric of soils, sediments, and other particulate materials. Backscattered scanning electron microscope (SEM) images of polished, resin-impregnated samples are grouped with the corresponding X-ray elemental maps using classification methods commonly used in remote sensing. However, the resulting mineral-segmented images require processing to render them suitable for quantification. In the past, this has been done subjectively and interactively, but the new objective methods described in this paper largely eliminate this subjectivity. An intensity gradient magnitude image of the original backscattered electron image is used as the basis of …

Morphological Filtering And Granulometric Analysis On Scanning Electron Micrographs: Applications In Materials Science, Murielle Prod'homme, Michel Coster, Liliane Chermant, Jean-Louis Chermant

Scanning Microscopy

For many applications, scanning electron microscopy (SEM) images reflect the granular texture of analysed objects. So it is important to characterise the morphology of this texture and also to filter these images. Because the size of the texture is the main criterion to be studied, we have focused our paper on granulometric analysis.

We present basic parameters, morphological filtering and granulometry for Rⁿ•R functions and their properties with local knowledge and anamorphosis.

Some applications in the domain of materials science illustrate these methods and present their suitable possibilities.