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Length Bias In The Measurements Of Carbon Nanotubes, Paul H. Kvam

Department of Math & Statistics Faculty Publications

To measure carbon nanotube lengths, atomic force microscopy and special software are used to identify and measure nanotubes on a square grid. Current practice does not include nanotubes that cross the grid, and, as a result, the sample is length-biased. The selection bias model can be demonstrated through Buffon’s needle problem, extended to general curves that more realistically represent the shape of nanotubes observed on a grid. In this article, the nonparametric maximum likelihood estimator is constructed for the length distribution of the nanotubes, and the consequences of the length bias are examined. Probability plots reveal that the corrected length …

Statistical Reliability With Applications, Paul H. Kvam, Jye-Chyi Lu

Department of Math & Statistics Faculty Publications

This chapter reviews fundamental ideas in reliability theory and inference. The first part of the chapter accounts for lifetime distributions that are used in engineering reliability analyis, including general properties of reliability distributions that pertain to lifetime for manufactured products. Certain distributions are formulated on the basis of simple physical properties, and other are more or less empirical. The first part of the chapter ends with a description of graphical and analytical methods to find appropriate lifetime distributions for a set of failure data.

The second part of the chapter describes statistical methods for analyzing reliability data, including maximum likelihood …

Nonparametric Bayes Estimation Of Contamination Levels Using Observations From The Residual Distribution, Paul H. Kvam, Ram C. Tiwari, Jyoti N. Zalkikar

Department of Math & Statistics Faculty Publications

A nonparametric Bayes estimator of the survival function is derived for right censored data where additional observations from the residual distribution are available. The estimation is motivated by data on contamination concentrations for chromium from one of the EPA's toxic waste sites. The residual sample can be produced by hot spot sampling, where only samples above a given threshold value are collected. The Dirichlet process is used to formulate prior information about the chromium contamination, and we compare the Bayes estimator of the mean concentration level to other estimators currently considered by the EPA and other sources. The Bayes estimator …