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Statistical Modeling And Simulation Of Variability And Reliability Of Cmos Technology, Khaled Hassan Md
Statistical Modeling And Simulation Of Variability And Reliability Of Cmos Technology, Khaled Hassan Md
Open Access Dissertations
The introduction of High-κ Metal Gate transistors led to higher integration density, low leakage current, and faster switching speed. However, this transition in technology roadmap brought about new failure mechanisms such as Positive Bias Temperature Instability and Stress Induced Leakage Current. In addition, the relentless downscaling of devices to keep up with Moore's law has significantly increased the time-zero variability caused by Random Dopant Fluctuation, Mean Gate Length Deviation, and Line Edge Roughness. Because of their possible correlation with time dependent aging effects, the quantification of reliability has become more complex than ever. To that effect, we propose a framework …
Comparison Of Clustered Rdf Data Stores, Venkata Patchigolla
Comparison Of Clustered Rdf Data Stores, Venkata Patchigolla
Purdue Polytechnic Masters Theses
Storing data in RDF format helps in simpler data interchange among different researchers compared to present approaches. There has been tremendous increase in the applications that use RDF data. The nature of RDF data is such that it tends to increase explosively. This makes it necessary to consider the time for retrieval and scalability of data while selecting a suitable RDF data store for developing applications. The research concentrates on comparing BigOWLIM. Bigdata, 4store and Virtuoso RDF stores on basis of their scalability and performance of storing and retrieving cancer proteomics and mass spectrometry data using SPARQL queries. In this …