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Patent Overlay Mapping: Visualizing Technological Distance, Luciano Kay, Nils Newman, Jan Youtie, Alan L. Porter, Ismael Rafols
Patent Overlay Mapping: Visualizing Technological Distance, Luciano Kay, Nils Newman, Jan Youtie, Alan L. Porter, Ismael Rafols
Jan Youtie
This paper presents a new global patent map that represents all technological categories and a method to locate patent data of individual organizations and technological fields on the global map. This overlay map technique may support competitive intelligence and policy decision making. The global patent map is based on similarities in citing-to-cited relationships between categories of the International Patent Classification (IPC) of European Patent Office (EPO) patents from 2000 to 2006. This patent data set, extracted from the PATSTAT database, includes 760,000 patent records in 466 IPC-based categories. We compare the global patent maps derived from this categorization to related …