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Quantitative High-Angle Annular Dark Field Scanning Transmission To Electron Microscopy For Materials Science, Rumyana Petrova
Quantitative High-Angle Annular Dark Field Scanning Transmission To Electron Microscopy For Materials Science, Rumyana Petrova
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Scanning transmission electron microscopy (STEM) has been widely used for characterization of materials; to identify micro- and nano-structures within a sample and to analyze crystal and defect structures. High-angle annular dark field (HAADF) STEM imaging using atomic number (Z) contrast has proven capable of resolving atomic structures with better than 2 A lateral resolution. In this work, the HAADF STEM imaging mode is used in combination with multislice simulations. This combination is applied to the investigation of the temperature dependence of the intensity collected by the HAADF detector in silicon, and to convergent beam electron diffraction (CBED) to measure the …