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Length Bias In The Measurements Of Carbon Nanotubes, Paul H. Kvam
Length Bias In The Measurements Of Carbon Nanotubes, Paul H. Kvam
Department of Math & Statistics Faculty Publications
To measure carbon nanotube lengths, atomic force microscopy and special software are used to identify and measure nanotubes on a square grid. Current practice does not include nanotubes that cross the grid, and, as a result, the sample is length-biased. The selection bias model can be demonstrated through Buffon’s needle problem, extended to general curves that more realistically represent the shape of nanotubes observed on a grid. In this article, the nonparametric maximum likelihood estimator is constructed for the length distribution of the nanotubes, and the consequences of the length bias are examined. Probability plots reveal that the corrected length …