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A Nonlinear Random Coefficients Model For Degradation Testing, Suk Joo Bae, Paul H. Kvam

Department of Math & Statistics Faculty Publications

As an alternative to traditional life testing, degradation tests can be effective in assessing product reliability when measurements of degradation leading to failure can be observed. This article presents a degradation model for highly reliable light displays, such as plasma display panels and vacuum fluorescent displays (VFDs). Standard degradation models fail to capture the burn-in characteristics of VFDs, when emitted light actually increases up to a certain point in time before it decreases (or degrades) continuously. Random coefficients are used to model this phenomenon in a nonlinear way, which allows for a nonmonotonic degradation path. In many situations, the relative …