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Qtl Mapping Of Panicle Architecture And Yield-Related Traits Between Two U.S. Rice Cultivars 'Lagrue' And 'Lemont', Adam D. Rice

Graduate Theses and Dissertations

Grain yield in rice consists of multiple yield components such as number of panicles/plant, number of tillers/plant, and number of seeds/panicle. Panicle architecture is an important yield trait yield as the number of seeds on a panicle greatly contributes to the overall panicle yield. A QTL analysis and mapping study on panicle architecture and yield-related traits was performed to identify major QTL and candidate genes associated with the traits. The first objective of the project was to do a yield study evaluating 15 agronomic traits between each of the four U.S. rice cultivars, ‘LaGrue’, ‘Lemont’, ‘Bengal’, and ‘Mars’, to determine …

Genetic Resistance To The Downy Mildew Pathogen And Mapping The Rpf Resistance Loci In Spinach, Gehendra Bhattarai

Graduate Theses and Dissertations

Spinach (Spinacia oleracea) is an important cool-season leafy vegetable crop in the United States (US). Downy mildew, caused by the obligate oomycete Peronospora effusa, is the most economically important disease of spinach. A total of 17 races of P. effusa have been reported on spinach, and many of these races (>10) have emerged in the last three decades. The new races of the pathogen are continually overcoming the genetic resistances used in the newly released cultivars.

A detached leaf inoculation assay was evaluated, standardized, and validated as a new method to differentiate resistant and susceptible spinach genotypes. Disease response …