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Engineering

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Virginia Commonwealth University

Theses/Dissertations

2007

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Low Dislocation Density Gallium Nitride Templates And Their Device Applications, Jinqiao Xie Jan 2007

Low Dislocation Density Gallium Nitride Templates And Their Device Applications, Jinqiao Xie

Theses and Dissertations

The unique properties, such as large direct bandgap, excellent thermal stability, high μH × ns, of III-nitrides make them ideal candidates for both optoelectronic and high-speed electronic devices. In the past decades, great success has been achieved in commercialization of GaN based light emitting diodes (LEDs) and laser diodes (LDs). However, due to the lack of native substrates, thin films grown on sapphire or SiC substrates have high defect densities that degrade the device performance and reliability. Conventional epitaxy lateral overgrowth (ELO) can reduce dislocation densities down to ∼10-6 cm-2 in the lateral growth area, but requires ex situ photolithography …