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- <p>Cavity resonators -- Mathematical models<br />Printed circuits -- Design<br />Dielectrics</p> (1)
- <p>Electromagnetic interference -- Analysis<br />Electromagnetic fields -- Testing -- Computer simulation<br />Electronic circuits -- Computer simulation<br />Shielding (Electricity)</p> (1)
- <p>Electromagnetic interference<br />Electromagnetic compatibility<br />Near-fields -- Measurement<br />Synthetic aperture radar<br />Three-dimensional printing</p> (1)
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- Channel emulator (1)
- Common Mode (1)
- Coupling Path (1)
- EMC (1)
- EMC/EMI (1)
- EMI (1)
- Electromagnetic compatibility<br />Electromagnetic interference<br />Near-fields -- Measurement (1)
- Electromagnetic interference (1)
- Lossy materials (1)
- Near field scanning (1)
- Optical tracking (1)
- Phase measurement (1)
- Printed Circuit Board (1)
Articles 1 - 4 of 4
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Emi Analysis Of Dvi Link Connectors, Abhishek Patnaik
Emi Analysis Of Dvi Link Connectors, Abhishek Patnaik
Masters Theses
"EMI problems are not uncommon in high speed communication systems. As the system clock frequencies increases, so does the challenges in controlling the EMI in such systems. A connector is a very important part of a high speed communication system. Electromagnetic interference (EMI) is found to be tightly correlated to mode conversion: from differential-mode (DM) signals to common-mode (CM) currents and further to antenna-mode (AM) currents on the outside of cables or enclosures. Moreover, in such high speed systems, coupling to an adjacent cable-connector system is not uncommon. It is essential to understand and quantify this coupling path in order …
The Development Of Near Field Probing Systems For Emc Near Field Visualization And Emi Source Localization, Hui He
Masters Theses
"The objectives of this research are to visualize the frequency dependent electromagnetic field distribution for electromagnetic compatibility (EMC) applications and the radiating source reconstruction on complex shaped electronic systems. This is achieved by combining near field probing with a system for automatically recording the probe position and orientation. Due to the complexity of the shape of the electronic systems of interest, and for utilizing the expertise of the user, the probe will be moved manually not robotically. Concurrently, the local near field will be recorded, associated with the location and displayed at near real time on the captured 3D geometry …
An Improved Planar Cavity Model For Dielectric Characterization, Benjamin Jay Conley
An Improved Planar Cavity Model For Dielectric Characterization, Benjamin Jay Conley
Masters Theses
"Accurate characterization of the dielectric properties of the laminate materials used in printed circuit board fabrication is critical for maximizing the performance of modern high speed circuitry. While many techniques exist for characterizing dielectric materials, most existing techniques are either limited in accuracy or highly impractical for use with planar, copper-clad laminate sheets. A common method involves forming a cavity from the printed circuit board material and calculating the permittivity and dissipation factor from the measured resonant frequencies and quality factor of the cavity. This resonance technique makes the assumption of an ideal cavity, which leads to errors in both …
Emission Source Microscopy Applications On Emi Source Localization And Emi Mitigation With Lossy Materials, Xiangyang Jiao
Emission Source Microscopy Applications On Emi Source Localization And Emi Mitigation With Lossy Materials, Xiangyang Jiao
Masters Theses
"In Section 1, the emission source microscopy (ESM) methodology will be introduced and used to identify the sources of radiation on different DUTs. As the new technology generation, the integration density and the operating speed of integrated circuits have been increasing steadily. However, root cause diagnostics to locate the source of EMI radiation is more problematic in the complex system. The ESM technique provides a powerful tool to detect and characterize the active sources of radiation. The amplitude and phase of fields are measured on a plane away from the DUT, and this measurement can get rid of the evanescent …