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Novel Memristor Based True Random Number Generator, Scott Stoller
Novel Memristor Based True Random Number Generator, Scott Stoller
Boise State University Theses and Dissertations
Random numbers are an important, but often overlooked part of the modern computing environment. They are used everywhere around us for a variety of purposes, from simple decision making in video games such as a coin toss, to securing financial transactions and encrypting confidential communications. They are even useful for gambling and the lottery.
Random numbers are generated in many ways. Pseudo random number generators (PRNGs) generate numbers based on a formula. True random number generators (TRNGs) capture entropy from the environment to generate randomness. As our society and our devices become more connected in the digital world, it is …
High- And Low-Voltage Mitigation In Distribution Systems Using Residential Static Volt-Ampere Reactive Compensators, Andrés Valdepeña Delgado
High- And Low-Voltage Mitigation In Distribution Systems Using Residential Static Volt-Ampere Reactive Compensators, Andrés Valdepeña Delgado
Boise State University Theses and Dissertations
Power distribution systems are experiencing a fast transformation from simple one-way radial feeders to complex systems with multiple sources and bidirectional power flows. The rapid increase of Distributed Generation (DG) connected to the distribution system over the last decade, especially solar photovoltaic (PV), has been the key element to this transformation.
The variable nature of PV-based DG has increased the complexity of voltage regulation in distribution systems. Electric Utilities are facing an increasing number of voltage issues in distribution systems with high penetration of DGs, leading customers to experience voltage levels outside of range A of the ANSI C84.1 standard. …
Low-Cost Test And Characterization Platform For Memristors, Lyle Jones
Low-Cost Test And Characterization Platform For Memristors, Lyle Jones
Boise State University Theses and Dissertations
The electrical Testing and Characterization of the devices built under research conditions on silicon wafers, diced wafers, or package parts have hampered research since the beginning of integrated circuits. The challenges of performing electrical characterization on devices are to acquire useful and accurate data, the ease of use of the test platform, the portability of the test equipment, the ability to automate quickly, to allow modifications to the platform, the ability to change the configuration of the Device Under Test (DUT) or the Memristor Based Design (MBD), and to do this within budget. The devices that this research is focused …