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Characterization Of Anisotropic Materials Using Scattered Field Measurements, Hirsch M. Chizever
Characterization Of Anisotropic Materials Using Scattered Field Measurements, Hirsch M. Chizever
Theses and Dissertations
This research uses monostatic far-zone scattered field measurements to estimate the permittivity of biaxial materials at X-Band. Utilizing Radar Cross Section (RCS) measurement techniques, this effort examines the efficacy of whole-sample TEM illumination in the estimation of anisotropic permittivity, in contrast with traditional subsample illumination methods. The research examines the impact that dielectric supports have on measurement error and uncertainty in permittivity estimates. Following an incremental approach, the research first demonstrates successful estimation of permittivity for isotropic spheres followed by a Teflon isotropic cube. Finally, the method is applied to uniaxial and biaxial cubes whose anisotropic permittivity is validated through …