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Evaluation Of Strain Distortion Correction Protocol Using Scanning Electron Microscopy And Digital Image Correlation, Alexandra Mallory, Alberto Mello, Michael Sangid

The Summer Undergraduate Research Fellowship (SURF) Symposium

Scanning electron microscopy in combination with digital image correlation (SEM-DIC) is a useful technique for measuring strain in materials at the micro-scale. In particular, it can be used to identify micro-scale strain localizations that are the precursor to material failure. While SEM produces high resolution images of the microstructure, the images also contain a large amount of distortion that, during DIC, will result in distorted strain values that require correction. In this project, a nickel-based alloy underwent cyclic mechanical fatigue at three different high temperatures to a targeted maximum strain. Scanning electron microscopy imaging was done on a 200x150μm area …